Yu-Shin Kuo, Huan-Kai Peng, Charles H.-P. Wen. Monte-Carlo-based statistical soft error rate (SSER) analysis for the deep sub-micron era. In International Symposium on Circuits and Systems (ISCAS 2010), May 30 - June 2, 2010, Paris, France. pages 3673-3676, IEEE, 2010. [doi]
@inproceedings{KuoPW10-0,
title = {Monte-Carlo-based statistical soft error rate (SSER) analysis for the deep sub-micron era},
author = {Yu-Shin Kuo and Huan-Kai Peng and Charles H.-P. Wen},
year = {2010},
doi = {10.1109/ISCAS.2010.5537775},
url = {http://dx.doi.org/10.1109/ISCAS.2010.5537775},
tags = {analysis},
researchr = {https://researchr.org/publication/KuoPW10-0},
cites = {0},
citedby = {0},
pages = {3673-3676},
booktitle = {International Symposium on Circuits and Systems (ISCAS 2010), May 30 - June 2, 2010, Paris, France},
publisher = {IEEE},
}