Yu-Shin Kuo, Huan-Kai Peng, Charles H.-P. Wen. Monte-Carlo-based statistical soft error rate (SSER) analysis for the deep sub-micron era. In International Symposium on Circuits and Systems (ISCAS 2010), May 30 - June 2, 2010, Paris, France. pages 3673-3676, IEEE, 2010. [doi]
Abstract is missing.