Nathan Kupp, He Huang, Petros Drineas, Yiorgos Makris. Post-production performance calibration in analog/RF devices. In Ron Press, Erik H. Volkerink, editors, 2011 IEEE International Test Conference, ITC 2010, Austin, TX, USA, November 2-4, 2010. pages 245-254, IEEE, 2010. [doi]
Abstract is missing.