Marek Kurzynski, Edward Puchala, Aleksander Rewak. The Bayes-Optimal Feature Extraction Procedure for Pattern Recognition Using Genetic Algorithm. In Stefanos D. Kollias, Andreas Stafylopatis, Wlodzislaw Duch, Erkki Oja, editors, Artificial Neural Networks - ICANN 2006, 16th International Conference, Athens, Greece, September 10-14, 2006. Proceedings, Part I. Volume 4131 of Lecture Notes in Computer Science, pages 21-30, Springer, 2006. [doi]