Keiichi Kushida, Nobuaki Otsuka, Osamu Hirabayashi, Yasuhisa Takeyama. DFT techniques for memory macro with built-in ECC. In 13th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2005), 3-5 August 2005, Taipei, Taiwan. pages 109-114, IEEE Computer Society, 2005. [doi]
@inproceedings{KushidaOHT05,
title = {DFT techniques for memory macro with built-in ECC},
author = {Keiichi Kushida and Nobuaki Otsuka and Osamu Hirabayashi and Yasuhisa Takeyama},
year = {2005},
doi = {10.1109/MTDT.2005.19},
url = {http://doi.ieeecomputersociety.org/10.1109/MTDT.2005.19},
researchr = {https://researchr.org/publication/KushidaOHT05},
cites = {0},
citedby = {0},
pages = {109-114},
booktitle = {13th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2005), 3-5 August 2005, Taipei, Taiwan},
publisher = {IEEE Computer Society},
isbn = {0-7695-2313-7},
}