Keiichi Kushida, Nobuaki Otsuka, Osamu Hirabayashi, Yasuhisa Takeyama. DFT techniques for memory macro with built-in ECC. In 13th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2005), 3-5 August 2005, Taipei, Taiwan. pages 109-114, IEEE Computer Society, 2005. [doi]
Abstract is missing.