Investigation of electromigration in micrometer-scale metal wires by in-situ optical microscopy - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Y. Kuwabara, S. Nishimura, R. Zaharuddin, J. Shirakashi. Investigation of electromigration in micrometer-scale metal wires by in-situ optical microscopy. In 6th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2011, Kaohsiung, Taiwan, February 20-23, 2011. pages 681-684, IEEE, 2011. [doi]

This author has not been identified. Look up 'Y. Kuwabara' in GoogleThis author has not been identified. Look up 'S. Nishimura' in GoogleThis author has not been identified. Look up 'R. Zaharuddin' in GoogleThis author has not been identified. Look up 'J. Shirakashi' in Google

runs on WebDSL