Y. Kuwabara, S. Nishimura, R. Zaharuddin, J. Shirakashi. Investigation of electromigration in micrometer-scale metal wires by in-situ optical microscopy. In 6th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2011, Kaohsiung, Taiwan, February 20-23, 2011. pages 681-684, IEEE, 2011. [doi]
@inproceedings{KuwabaraNZS11,
title = {Investigation of electromigration in micrometer-scale metal wires by in-situ optical microscopy},
author = {Y. Kuwabara and S. Nishimura and R. Zaharuddin and J. Shirakashi},
year = {2011},
doi = {10.1109/NEMS.2011.6017446},
url = {http://dx.doi.org/10.1109/NEMS.2011.6017446},
researchr = {https://researchr.org/publication/KuwabaraNZS11},
cites = {0},
citedby = {0},
pages = {681-684},
booktitle = {6th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2011, Kaohsiung, Taiwan, February 20-23, 2011},
publisher = {IEEE},
}