Daehyun Kwon, Heon Su Jeong, Jaemin Choi, Wijong Kim, Jae-Woong Kim, Junsub Yoon, Jungmin Choi, Sanguk Lee, Hyunsub Norbert Rie, Jin-Il Lee, Jongbum Lee, Taeseong Jang, Junhyung Kim, Sanghee Kang, Jung-Bum Shin, Yanggyoon Loh, Chang-Yong Lee, Junmyung Woo, Hye-Seung Yu, Changhyun Bae, Reum Oh, Young-Soo Sohn, Changsik Yoo, Jooyoung Lee. A 1.1V 6.4Gb/s/pin 24-Gb DDR5 SDRAM with a Highly-Accurate Duty Corrector and NBTI-Tolerant DLL. In IEEE International Solid- State Circuits Conference, ISSCC 2023, San Francisco, CA, USA, February 19-23, 2023. pages 412-413, IEEE, 2023. [doi]
@inproceedings{KwonJCKKYCLRLLJKKSLLWYBOSYL23,
title = {A 1.1V 6.4Gb/s/pin 24-Gb DDR5 SDRAM with a Highly-Accurate Duty Corrector and NBTI-Tolerant DLL},
author = {Daehyun Kwon and Heon Su Jeong and Jaemin Choi and Wijong Kim and Jae-Woong Kim and Junsub Yoon and Jungmin Choi and Sanguk Lee and Hyunsub Norbert Rie and Jin-Il Lee and Jongbum Lee and Taeseong Jang and Junhyung Kim and Sanghee Kang and Jung-Bum Shin and Yanggyoon Loh and Chang-Yong Lee and Junmyung Woo and Hye-Seung Yu and Changhyun Bae and Reum Oh and Young-Soo Sohn and Changsik Yoo and Jooyoung Lee},
year = {2023},
doi = {10.1109/ISSCC42615.2023.10067651},
url = {https://doi.org/10.1109/ISSCC42615.2023.10067651},
researchr = {https://researchr.org/publication/KwonJCKKYCLRLLJKKSLLWYBOSYL23},
cites = {0},
citedby = {0},
pages = {412-413},
booktitle = {IEEE International Solid- State Circuits Conference, ISSCC 2023, San Francisco, CA, USA, February 19-23, 2023},
publisher = {IEEE},
isbn = {978-1-6654-9016-0},
}