Additive Statistical Leakage Analysis Using Exponential Mixture Model

Hyun-jeong Kwon, Sung Yun Lee, Young-Hwan Kim, Seokhyeong Kang. Additive Statistical Leakage Analysis Using Exponential Mixture Model. IEEE Trans. on CAD of Integrated Circuits and Systems, 39(12):4985-4998, 2020. [doi]

Abstract

Abstract is missing.