Tae-Jin Kwon, Sang-Hoon Lee, Tae-Seon Kim, Hoe-Jin Lee, Young-Kwan Park, Taek-Soo Kim, Seok-Jin Kim, Jeong-Taek Kong. Performance Improvement for High Speed Devices Using E-tests and the SPICE Model. In 2nd International Symposium on Quality of Electronic Design (ISQED 2001), 26-28 March 2001, San Jose, CA, USA. pages 443, IEEE Computer Society, 2001. [doi]
Abstract is missing.