Hole analysis for functional coverage data

Oded Lachish, Eitan Marcus, Shmuel Ur, Avi Ziv. Hole analysis for functional coverage data. In Proceedings of the 39th Design Automation Conference, DAC 2002, New Orleans, LA, USA, June 10-14, 2002. pages 807-812, ACM, 2002. [doi]

Authors

Oded Lachish

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Eitan Marcus

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Shmuel Ur

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Avi Ziv

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