Oded Lachish, Eitan Marcus, Shmuel Ur, Avi Ziv. Hole analysis for functional coverage data. In Proceedings of the 39th Design Automation Conference, DAC 2002, New Orleans, LA, USA, June 10-14, 2002. pages 807-812, ACM, 2002. [doi]
@inproceedings{LachishMUZ02,
title = {Hole analysis for functional coverage data},
author = {Oded Lachish and Eitan Marcus and Shmuel Ur and Avi Ziv},
year = {2002},
doi = {10.1145/513918.514119},
url = {http://doi.acm.org/10.1145/513918.514119},
tags = {analysis, data-flow, data-flow analysis, coverage},
researchr = {https://researchr.org/publication/LachishMUZ02},
cites = {0},
citedby = {0},
pages = {807-812},
booktitle = {Proceedings of the 39th Design Automation Conference, DAC 2002, New Orleans, LA, USA, June 10-14, 2002},
publisher = {ACM},
isbn = {1-58113-461-4},
}