Enhancing analog yield optimization for variation-aware circuits sizing

Ons Lahiouel, Mohamed H. Zaki, Sofiène Tahar. Enhancing analog yield optimization for variation-aware circuits sizing. In David Atienza, Giorgio Di Natale, editors, Design, Automation & Test in Europe Conference & Exhibition, DATE 2017, Lausanne, Switzerland, March 27-31, 2017. pages 1273-1276, IEEE, 2017. [doi]

Abstract

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