Programmable Scan-Based Logic Built-In Self Test

Liyang Lai, Wu-Tung Cheng, Thomas Rinderknecht. Programmable Scan-Based Logic Built-In Self Test. In 16th Asian Test Symposium, ATS 2007, Beijing, China, October 8-11, 2007. pages 371-377, IEEE, 2007. [doi]

Abstract

Abstract is missing.