Y. T. K. Lai, J. S. Hu, Y. H. Tsai, W. Y. Chiu. Industrial Anomaly Detection and One-class Classification using Generative Adversarial Networks. In 2018 IEEE/ASME International Conference on Advanced Intelligent Mechatronics, AIM 2018, Auckland, New Zealand, July 9-12, 2018. pages 1444-1449, IEEE, 2018. [doi]
@inproceedings{LaiHTC18,
title = {Industrial Anomaly Detection and One-class Classification using Generative Adversarial Networks},
author = {Y. T. K. Lai and J. S. Hu and Y. H. Tsai and W. Y. Chiu},
year = {2018},
doi = {10.1109/AIM.2018.8452228},
url = {https://doi.org/10.1109/AIM.2018.8452228},
researchr = {https://researchr.org/publication/LaiHTC18},
cites = {0},
citedby = {0},
pages = {1444-1449},
booktitle = {2018 IEEE/ASME International Conference on Advanced Intelligent Mechatronics, AIM 2018, Auckland, New Zealand, July 9-12, 2018},
publisher = {IEEE},
isbn = {978-1-5386-1854-7},
}