Logic BIST with Scan Chain Segmentation

Liyang Lai, Janak H. Patel, Thomas Rinderknecht, Wu-Tung Cheng. Logic BIST with Scan Chain Segmentation. In Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA. pages 57-66, IEEE, 2004. [doi]

Authors

Liyang Lai

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Janak H. Patel

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Thomas Rinderknecht

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Wu-Tung Cheng

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