Liyang Lai, Janak H. Patel, Thomas Rinderknecht, Wu-Tung Cheng. Logic BIST with Scan Chain Segmentation. In Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA. pages 57-66, IEEE, 2004. [doi]
@inproceedings{LaiPRC04,
title = {Logic BIST with Scan Chain Segmentation},
author = {Liyang Lai and Janak H. Patel and Thomas Rinderknecht and Wu-Tung Cheng},
year = {2004},
doi = {10.1109/ITC.2004.115},
url = {http://doi.ieeecomputersociety.org/10.1109/ITC.2004.115},
tags = {logic},
researchr = {https://researchr.org/publication/LaiPRC04},
cites = {0},
citedby = {0},
pages = {57-66},
booktitle = {Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA},
publisher = {IEEE},
isbn = {0-7803-8581-0},
}