Low-Power BIST With a Smoother and Scan-Chain Reorder Under Optimal Cluster Size

N.-C. Lai, S. J. Wang, Y.-H. Fu. Low-Power BIST With a Smoother and Scan-Chain Reorder Under Optimal Cluster Size. IEEE Trans. on CAD of Integrated Circuits and Systems, 25(11):2586-2594, 2006. [doi]

Abstract

Abstract is missing.