Marcello Lajolo, Maurizio Rebaudengo, Matteo Sonza Reorda, Massimo Violante, Luciano Lavagno. Behavioral-level test vector generation for system-on-chip designs. In Proceedings of the IEEE International High-Level Design Validation and Test Workshop 2000, Berkeley, California, USA, November 8-10, 2000. pages 21-26, IEEE Computer Society, 2000. [doi]
Abstract is missing.