Exploiting defect clustering to screen bare die for infant mortality failures: an experimental study - researchr publication authors

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David R. Lakin II, Adit D. Singh. Exploiting defect clustering to screen bare die for infant mortality failures: an experimental study. In Proceedings IEEE International Test Conference 1999, Atlantic City, NJ, USA, 27-30 September 1999. pages 23-30, IEEE Computer Society, 1999.

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