David R. Lakin II, Adit D. Singh. Exploiting defect clustering to screen bare die for infant mortality failures: an experimental study. In Proceedings IEEE International Test Conference 1999, Atlantic City, NJ, USA, 27-30 September 1999. pages 23-30, IEEE Computer Society, 1999.
@inproceedings{LakinS99,
title = {Exploiting defect clustering to screen bare die for infant mortality failures: an experimental study},
author = {David R. Lakin II and Adit D. Singh},
year = {1999},
researchr = {https://researchr.org/publication/LakinS99},
cites = {0},
citedby = {0},
pages = {23-30},
booktitle = {Proceedings IEEE International Test Conference 1999, Atlantic City, NJ, USA, 27-30 September 1999},
publisher = {IEEE Computer Society},
}