Design of a Window Comparator with Adaptive Error Threshold for Online Testing Applications

Amit Laknaur, Rui Xiao, Sai Raghuram Durbha, Haibo Wang. Design of a Window Comparator with Adaptive Error Threshold for Online Testing Applications. In 8th International Symposium on Quality of Electronic Design (ISQED 2007), 26-28 March 2007, San Jose, CA, USA. pages 501-506, IEEE Computer Society, 2007. [doi]

Authors

Amit Laknaur

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Rui Xiao

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Sai Raghuram Durbha

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Haibo Wang

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