Amit Laknaur, Rui Xiao, Sai Raghuram Durbha, Haibo Wang. Design of a Window Comparator with Adaptive Error Threshold for Online Testing Applications. In 8th International Symposium on Quality of Electronic Design (ISQED 2007), 26-28 March 2007, San Jose, CA, USA. pages 501-506, IEEE Computer Society, 2007. [doi]
@inproceedings{LaknaurXDW07,
title = {Design of a Window Comparator with Adaptive Error Threshold for Online Testing Applications},
author = {Amit Laknaur and Rui Xiao and Sai Raghuram Durbha and Haibo Wang},
year = {2007},
doi = {10.1109/ISQED.2007.57},
url = {http://doi.ieeecomputersociety.org/10.1109/ISQED.2007.57},
tags = {testing, design},
researchr = {https://researchr.org/publication/LaknaurXDW07},
cites = {0},
citedby = {0},
pages = {501-506},
booktitle = {8th International Symposium on Quality of Electronic Design (ISQED 2007), 26-28 March 2007, San Jose, CA, USA},
publisher = {IEEE Computer Society},
isbn = {978-0-7695-2795-6},
}