Amit Laknaur, Rui Xiao, Sai Raghuram Durbha, Haibo Wang. Design of a Window Comparator with Adaptive Error Threshold for Online Testing Applications. In 8th International Symposium on Quality of Electronic Design (ISQED 2007), 26-28 March 2007, San Jose, CA, USA. pages 501-506, IEEE Computer Society, 2007. [doi]
Abstract is missing.