An Integrated Deep Learning Approach towards Automatic Evaluation of Ki-67 Labeling Index

S. Lakshmi, Deepu Vijayasenan, David S. Sumam, Saraswathy Sreeram, Pooja K. Suresh. An Integrated Deep Learning Approach towards Automatic Evaluation of Ki-67 Labeling Index. In TENCON 2019 - 2019 IEEE Region 10 Conference (TENCON), Kochi, India, October 17-20, 2019. pages 2310-2314, IEEE, 2019. [doi]

Authors

S. Lakshmi

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Deepu Vijayasenan

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David S. Sumam

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Saraswathy Sreeram

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Pooja K. Suresh

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