An Integrated Deep Learning Approach towards Automatic Evaluation of Ki-67 Labeling Index

S. Lakshmi, Deepu Vijayasenan, David S. Sumam, Saraswathy Sreeram, Pooja K. Suresh. An Integrated Deep Learning Approach towards Automatic Evaluation of Ki-67 Labeling Index. In TENCON 2019 - 2019 IEEE Region 10 Conference (TENCON), Kochi, India, October 17-20, 2019. pages 2310-2314, IEEE, 2019. [doi]

Abstract

Abstract is missing.