An Integrated Deep Learning Approach towards Automatic Evaluation of Ki-67 Labeling Index

S. Lakshmi, Deepu Vijayasenan, David S. Sumam, Saraswathy Sreeram, Pooja K. Suresh. An Integrated Deep Learning Approach towards Automatic Evaluation of Ki-67 Labeling Index. In TENCON 2019 - 2019 IEEE Region 10 Conference (TENCON), Kochi, India, October 17-20, 2019. pages 2310-2314, IEEE, 2019. [doi]

@inproceedings{LakshmiVSSS19,
  title = {An Integrated Deep Learning Approach towards Automatic Evaluation of Ki-67 Labeling Index},
  author = {S. Lakshmi and Deepu Vijayasenan and David S. Sumam and Saraswathy Sreeram and Pooja K. Suresh},
  year = {2019},
  doi = {10.1109/TENCON.2019.8929640},
  url = {https://doi.org/10.1109/TENCON.2019.8929640},
  researchr = {https://researchr.org/publication/LakshmiVSSS19},
  cites = {0},
  citedby = {0},
  pages = {2310-2314},
  booktitle = {TENCON 2019 - 2019 IEEE Region 10 Conference (TENCON), Kochi, India, October 17-20, 2019},
  publisher = {IEEE},
  isbn = {978-1-7281-1895-6},
}