PostPINN-EM: Fast Post-Voiding Electromigration Analysis Using Two-Stage Physics-Informed Neural Networks - researchr publication authors

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Subed Lamichhane, Wentian Jin, Liang Chen 0025, Mohammadamir Kavousi, Sheldon X.-D. Tan. PostPINN-EM: Fast Post-Voiding Electromigration Analysis Using Two-Stage Physics-Informed Neural Networks. In IEEE/ACM International Conference on Computer Aided Design, ICCAD 2023, San Francisco, CA, USA, October 28 - Nov. 2, 2023. pages 1-9, IEEE, 2023. [doi]

This author has not been identified. Look up 'Subed Lamichhane' in GoogleThis author has not been identified. Look up 'Wentian Jin' in GoogleThis author has not been identified. Look up 'Liang Chen 0025' in GoogleThis author has not been identified. Look up 'Mohammadamir Kavousi' in GoogleThis author has not been identified. Look up 'Sheldon X.-D. Tan' in Google

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