Subed Lamichhane, Wentian Jin, Liang Chen 0025, Mohammadamir Kavousi, Sheldon X.-D. Tan. PostPINN-EM: Fast Post-Voiding Electromigration Analysis Using Two-Stage Physics-Informed Neural Networks. In IEEE/ACM International Conference on Computer Aided Design, ICCAD 2023, San Francisco, CA, USA, October 28 - Nov. 2, 2023. pages 1-9, IEEE, 2023. [doi]
Abstract is missing.