Applications of the IEEE P1149.5 Module Test and Maintenance Bus

David L. Landis, Chuck Hudson, Patrick F. McHugh. Applications of the IEEE P1149.5 Module Test and Maintenance Bus. In Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992. pages 984-992, IEEE Computer Society, 1992.

Abstract

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