Leandro Lanzieri, Görschwin Fey, Holger Schlarb, Thomas C. Schmidt. Auto-Generating Ageing Self-Tests with Hardware in the Loop for Commercial Microcontrollers. In IEEE European Test Symposium, ETS 2026, Chania, Greece, May 25-29, 2026. pages 1-4, IEEE, 2026. [doi]
Abstract is missing.