C. Laoudias, Dimitris Nikolos. A new test pattern generator for high defect coverage in a BIST environment. In David Garrett, John Lach, Charles A. Zukowski, editors, Proceedings of the 14th ACM Great Lakes Symposium on VLSI 2004, Boston, MA, USA, April 26-28, 2004. pages 417-420, ACM, 2004. [doi]
@inproceedings{LaoudiasN04,
title = {A new test pattern generator for high defect coverage in a BIST environment},
author = {C. Laoudias and Dimitris Nikolos},
year = {2004},
doi = {10.1145/988952.989052},
url = {http://doi.acm.org/10.1145/988952.989052},
tags = {test coverage, meta-model, testing, C++, Meta-Environment, coverage, meta-objects},
researchr = {https://researchr.org/publication/LaoudiasN04},
cites = {0},
citedby = {0},
pages = {417-420},
booktitle = {Proceedings of the 14th ACM Great Lakes Symposium on VLSI 2004, Boston, MA, USA, April 26-28, 2004},
editor = {David Garrett and John Lach and Charles A. Zukowski},
publisher = {ACM},
isbn = {1-58113-853-9},
}