A new test pattern generator for high defect coverage in a BIST environment

C. Laoudias, Dimitris Nikolos. A new test pattern generator for high defect coverage in a BIST environment. In David Garrett, John Lach, Charles A. Zukowski, editors, Proceedings of the 14th ACM Great Lakes Symposium on VLSI 2004, Boston, MA, USA, April 26-28, 2004. pages 417-420, ACM, 2004. [doi]

Abstract

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