Jan Lappas, André Lucas Chinazzo, Christian Weis, Chenyang Xia, Zhihang Wu, Leibin Ni, Norbert Wehn. Revisiting Pass-Transistor Logic Styles in a 12nm FinFET Technology Node. In Cristiana Bolchini, Ingrid Verbauwhede, Ioana Vatajelu, editors, 2022 Design, Automation & Test in Europe Conference & Exhibition, DATE 2022, Antwerp, Belgium, March 14-23, 2022. pages 1083-1084, IEEE, 2022. [doi]
@inproceedings{LappasCWXWNW22,
title = {Revisiting Pass-Transistor Logic Styles in a 12nm FinFET Technology Node},
author = {Jan Lappas and André Lucas Chinazzo and Christian Weis and Chenyang Xia and Zhihang Wu and Leibin Ni and Norbert Wehn},
year = {2022},
doi = {10.23919/DATE54114.2022.9774561},
url = {https://doi.org/10.23919/DATE54114.2022.9774561},
researchr = {https://researchr.org/publication/LappasCWXWNW22},
cites = {0},
citedby = {0},
pages = {1083-1084},
booktitle = {2022 Design, Automation & Test in Europe Conference & Exhibition, DATE 2022, Antwerp, Belgium, March 14-23, 2022},
editor = {Cristiana Bolchini and Ingrid Verbauwhede and Ioana Vatajelu},
publisher = {IEEE},
isbn = {978-3-9819263-6-1},
}