Jan Lappas, André Lucas Chinazzo, Christian Weis, Chenyang Xia, Zhihang Wu, Leibin Ni, Norbert Wehn. Revisiting Pass-Transistor Logic Styles in a 12nm FinFET Technology Node. In Cristiana Bolchini, Ingrid Verbauwhede, Ioana Vatajelu, editors, 2022 Design, Automation & Test in Europe Conference & Exhibition, DATE 2022, Antwerp, Belgium, March 14-23, 2022. pages 1083-1084, IEEE, 2022. [doi]
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