Deriving FSM-based tests using $a, b-\text{faults}$ for Logic Circuits - researchr publication authors

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Andrey Laputenko, Nina Yevtushenko 0001, Valentina Andreeva, Anzhela Yu. Matrosova. Deriving FSM-based tests using $a, b-\text{faults}$ for Logic Circuits. In IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2022, Nicosia, Cyprus, July 4-6, 2022. pages 80-85, IEEE, 2022. [doi]

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