Andrey Laputenko, Nina Yevtushenko 0001, Valentina Andreeva, Anzhela Yu. Matrosova. Deriving FSM-based tests using $a, b-\text{faults}$ for Logic Circuits. In IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2022, Nicosia, Cyprus, July 4-6, 2022. pages 80-85, IEEE, 2022. [doi]
@inproceedings{LaputenkoYAM22,
title = {Deriving FSM-based tests using $a, b-\text{faults}$ for Logic Circuits},
author = {Andrey Laputenko and Nina Yevtushenko 0001 and Valentina Andreeva and Anzhela Yu. Matrosova},
year = {2022},
doi = {10.1109/ISVLSI54635.2022.00027},
url = {https://doi.org/10.1109/ISVLSI54635.2022.00027},
researchr = {https://researchr.org/publication/LaputenkoYAM22},
cites = {0},
citedby = {0},
pages = {80-85},
booktitle = {IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2022, Nicosia, Cyprus, July 4-6, 2022},
publisher = {IEEE},
isbn = {978-1-6654-6605-9},
}