Bernd Laquai. A Model-based Test Approach for Testing High-Speed PLLs and Phase Regulation Circuitry in SOC Devices. In Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA. pages 764-772, IEEE, 2004. [doi]
@inproceedings{Laquai04,
title = {A Model-based Test Approach for Testing High-Speed PLLs and Phase Regulation Circuitry in SOC Devices},
author = {Bernd Laquai},
year = {2004},
doi = {10.1109/ITC.2004.17},
url = {http://doi.ieeecomputersociety.org/10.1109/ITC.2004.17},
tags = {rule-based, testing, systematic-approach},
researchr = {https://researchr.org/publication/Laquai04},
cites = {0},
citedby = {0},
pages = {764-772},
booktitle = {Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA},
publisher = {IEEE},
isbn = {0-7803-8581-0},
}