Seyed Saber Nabavi Larimi, Behzad Salami 0001, Osman S. Unsal, Adrián Cristal Kestelman, Hamid Sarbazi-Azad, Onur Mutlu. Understanding Power Consumption and Reliability of High-Bandwidth Memory with Voltage Underscaling. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2021, Grenoble, France, February 1-5, 2021. pages 517-522, IEEE, 2021. [doi]
Abstract is missing.