Efficient test solutions for core-based designs

Erik Larsson, Klas Arvidsson, Hideo Fujiwara, Zebo Peng. Efficient test solutions for core-based designs. IEEE Trans. on CAD of Integrated Circuits and Systems, 23(5):758-775, 2004. [doi]

Authors

Erik Larsson

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Klas Arvidsson

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Hideo Fujiwara

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Zebo Peng

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