Erik Larsson, Klas Arvidsson, Hideo Fujiwara, Zebo Peng. Efficient test solutions for core-based designs. IEEE Trans. on CAD of Integrated Circuits and Systems, 23(5):758-775, 2004. [doi]
@article{LarssonAFP04,
title = {Efficient test solutions for core-based designs},
author = {Erik Larsson and Klas Arvidsson and Hideo Fujiwara and Zebo Peng},
year = {2004},
doi = {10.1109/TCAD.2004.826560},
url = {http://doi.ieeecomputersociety.org/10.1109/TCAD.2004.826560},
tags = {rule-based, testing},
researchr = {https://researchr.org/publication/LarssonAFP04},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {23},
number = {5},
pages = {758-775},
}