IDVP (Intra-Die Variation Probe) for System-On-Chip (SoC) Infant Mortality screen - researchr publication authors

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Mohd Azman Abdul Latif, Noohul Basheer Zain Ali, Fawnizu Azmadi Hussin. IDVP (Intra-Die Variation Probe) for System-On-Chip (SoC) Infant Mortality screen. In International Symposium on Circuits and Systems (ISCAS 2011), May 15-19 2011, Rio de Janeiro, Brazil. pages 2055-2058, IEEE, 2011. [doi]

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