Mohd Azman Abdul Latif, Noohul Basheer Zain Ali, Fawnizu Azmadi Hussin. Design for cold test elimination - facing the Inverse Temperature Dependence (ITD) challenge. In 2012 IEEE International Symposium on Circuits and Systems, ISCAS 2012, Seoul, Korea (South), May 20-23, 2012. pages 3081-3085, IEEE, 2012. [doi]
Abstract is missing.