Luca Laurin, Matteo Baldo, Elisa Petroni, Giulia Samanni, L. Turconi, A. Motta, Massimo Borghi, A. Serafini, D. Codegoni, M. Scuderi, S. Ran, A. Claverie, Daniele Ielmini, R. Annunziata, Andrea Redaelli. Unveiling Retention Physical Mechanism of Ge-rich GST ePCM Technology. In IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023. pages 1-7, IEEE, 2023. [doi]
Abstract is missing.