Short Circuit Faults in State-of-the-Art ADCs - Are They Hard or Soft?

A. Lechner, Andrew Richardson, B. Hermes. Short Circuit Faults in State-of-the-Art ADCs - Are They Hard or Soft?. In 10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan. pages 417-422, IEEE Computer Society, 2001. [doi]

Abstract

Abstract is missing.