A. Lechner, Andrew Richardson, B. Hermes, Michael J. Ohletz. A Design for Testability Study on a High Performance Automatic Gain Control Circuit. In 16th IEEE VLSI Test Symposium (VTS 98), 28 April - 1 May 1998, Princeton, NJ, USA. pages 376-385, IEEE Computer Society, 1998. [doi]
Abstract is missing.