Identifiability of a Series of Discrete Process Cycles Based on Multirate Data

Cheol W. Lee. Identifiability of a Series of Discrete Process Cycles Based on Multirate Data. In 2020 American Control Conference, ACC 2020, Denver, CO, USA, July 1-3, 2020. pages 5163-5168, IEEE, 2020. [doi]

Abstract

Abstract is missing.