Il-soo Lee, Tony Ambler. Two efficient methods to reduce power and testing time. In Kaushik Roy, Vivek Tiwari, editors, Proceedings of the 2005 International Symposium on Low Power Electronics and Design, 2005, San Diego, California, USA, August 8-10, 2005. pages 167-172, ACM, 2005. [doi]
Abstract is missing.