Critical path identification and delay tests of dynamic circuits - researchr publication

researchr

You are not signed in
Sign in
Sign up

Kyung Tek Lee, Jacob A. Abraham. Critical path identification and delay tests of dynamic circuits. In Proceedings IEEE International Test Conference 1999, Atlantic City, NJ, USA, 27-30 September 1999. pages 421-430, IEEE Computer Society, 1999.

Abstract is missing.

runs on WebDSL